Quantum Focus Instruments Corporation was founded in 1997 as a spin-off from EDO/Barnes Engineering. EDO/Barnes was a well-known pioneer in IR detectors and systems (first infrared microscope 1963), as well as in the field of photoemission microscopy. IP, patents, technology and applications expertise were transferred to QFI in order to support QFI’s goals to manufacture and market failure analysis and temperature measurement microscopy systems.
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Defect Inspection

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