The combination of Scanning Probe Microscopy (SPM) and Scanning Electron/Auger Microscopy (SEM/SAM/FIB) is the perfect complement of imaging speed and resolution from millimeter field of views down to the atomic scale. The Curlew in situ SPM provides the possibility of the analysis, probing, and manipulation of the same sample feature by SPM and SEM/SAM/FIB techniques without the need for time-consuming feature back-tracing.
